Nanometrics Incorporated

As of October 25, 2019, Nanometrics Incorporated was acquired by Rudolph Technologies, Inc., in a reverse merger transaction. Onto Innovation Inc. provides process control metrology and inspection systems for use primarily in the fabrication of semiconductors and other solid-state devices, and industrial and scientific applications worldwide. The company offers automated metrology systems that provide optical critical dimension, thin film metrology, and wafer stress metrology for transistor and interconnect metrology applications; and integrated metrology systems that are installed onto wafer processing equipment to provide near real-time measurements. Its materials characterization products include systems that are used to monitor the physical, optical, electrical, and material characteristics of discrete electronic industry; opto-electronic; high brightness LED; solar photovoltaic; compound semiconductor; strained silicon; and silicon-on-insulator devices, including composition, crystal structure, layer thickness, dopant concentration, contamination, and electron mobility. The company also offers NanoDiffract, a modeling, visualization, and analysis software that takes signals from the metrology systems providing critical dimension, thickness, and optical properties from in line measurements; SpectraProbe, a model-less fitting engine that enables fast time to solution for in-line excursion detection and control; and NanoGen, an enterprise scale computing hardware system that is deployed to run the computing intensive analysis software. Onto Innovation Inc. was founded in 1975 and is headquartered in Wilmington, Massachusetts.